01
Wafer conditions
Size (200 / 300 mm), thickness range, surface condition (coated or not), the parameters you need measured and the specification they must meet.
Contact
Evaluation, specification discussions, a data comparison against your existing tool, or a technical review — please use the contact details below. Material that requires a non-disclosure agreement can be provided once one is in place.
| Address | 9F 907-ho, 878 Dongtansunhwandaero, Hwaseong-si, Gyeonggi-do, Republic of Korea |
|---|---|
| Tel | +82-10-2343-1634 |
| Fax | +82-504-046-1634 |
| jhkim@zilab.co.kr | |
| Website | www.zilab.co.kr |
What to send
01
Size (200 / 300 mm), thickness range, surface condition (coated or not), the parameters you need measured and the specification they must meet.
02
Required throughput, number of sorting grades, whether host integration (MES or database) is needed, and your floor space and utility conditions.
03
If the numbers have to match a tool you already run, send a reference wafer or that tool results and we will compare directly.